# Eec 236 Theory Pdf Free !FULL!

Units: 5 (3 Lecture; 3 Laboratory; 1 Discussion)Prerequisites: EEC 110A; EEC 130BCatalog Description: The study of Radio Frequency and Microwave theory and practice for design of wireless electronic systems. Transmission lines, microwave integrated circuits, circuit analyis of electromagnetic energy transfer systems, the scattering parameters. GE Credit: SEExpanded Course Description:I. Wireless Systems and Architectures A. Wireless System Fundamentals B. Terrestrial Wireless Systems C. Satellite Based Systems D. Wireless Applications to DefenseII. Techniques for Energy Transfer in Wireless Systems A. Analysis of Solid Conductors i. Internal impedance of a plane conductor ii. Power loss in a plane conductor iii. Current distribution in a circular wire iv. Impedance of round wires at high frequencies B. Transmission Lines and Waveguides i. Transmission line-field analysis, distributed circuit analysis, transmission line parameters, terminated transmission line ii. Coaxial and two wire lines and parameters iii. Rectangular and circular waveguides C. Microwave Integrated Circuit Lines i. Stripline realizations and parameters ii. Microstripline realizations and components iii. Coupled linesIII. Wireless System Circuit Analysis Techniques A. Impedance Descriptions of Transmission Line and Waveguide Elements B. Two-port Junctions C. The Scattering Parameters D. Other Useful High Frequency Circuit DescriptionsIV. Passive Circuits and Devices for Wireless Systems A. Impedance Transformation and Matching i. Impedance matching with reactive elements ii. Stub matching networks iii. Quarter wavelength transformers iv. Binomial and Chebychev transformers v. Computer oriented design techniques

## eec 236 theory pdf free

Units: 5 (3 Lecture; 3 Laboratory; 1 Discussion)Prerequisites: EEC 132BCatalog Description: RF and microwave amplifier theory and design, including transistor circuit models, stability considerations, noise models and low noise design. Theory and design of microwave transistor oscillators and mixers. Wireless system design and analysis. GE Credit: SEExpanded Course Description:I. Review of RF/Microwave Systems for Wireless CommunicationsII. Microwave Amplifiers A. Circuit models for microwave transistor characteristics B. Transistor parameters i. Measurement and modeling of microwave transistor characteristic C. Stability and amplifier design D. Design using scattering parameters i. Narrow band design 1. Design and fabrication of a narrow band low noise microwave transistor ii. Low Noise Design 1. Noise in two ports 2. Noise Figure 3. Optimum Design iii. Wide band DesignIII. RF and Microwave Oscillators A. One port negative resistance oscillators B. Two port negative resistance oscillators C. Oscillator configurationIV. Microwave MixersV. Wireless Systems and Propagation Phenomena

Units: 4 (3 Lecture; 1 Discussion) Prerequisites: EEC 140ACatalog Description: Electrical properties, design, models, and advanced concepts for MOSFET and bipolar devices. Introduction to junction field effect transistors (JFETs, MESFETs) and hetero-junction bipolar transistors (HBTs). Fundamentals of photonic devices, including solar cells, photodetectors, LEDs and semiconductor lasers. GE Credit: SEExpanded Course Description:I. Semiconductor Physics A. Atomic bonding, impurities and defects B. Diffusion and Field in a graded-impurity region C. Hall EffectII. Carrier Behavior A. Excess carriers and quasi-Fermi levels B. Ambipolar transport C. Scattering and lifetime mechanisms D. Surface and interface effectsIII. Advanced MOS concepts A. Scaling and scaling theory B. Small-feature MOS effects C. Fabrication methods and associated phenomena D. Simulation modelsIV. Advanced Bipolar Junction Transistor concepts A. Non-idealities of p-n junctions B. Kirk effect and other second-order phenomena C. Fabrication technologies and consequences on performance D. Switching behavior, charge storage, frequency limitationsV. Other Junction Devices and Phenomena A. Heterojunctions B. Thyristors and SCR devices C. LatchupVI. Photonics A. Optical absorption B. Photovoltaics and solar cells C. Photoconductors and photodetectors D. Light-emitting diodes E. Semiconductor lasers

Units: 4 (3 Lecture; 3 Laboratory)Prerequisites: EEC 157ACatalog Description: Control system optimization and compensation techniques, digital control theory. Laboratory includes Servo system experiments and computer simulation studies. GE Credit: SEExpanded Course Description:I. The Design and Compensation of Feedback Control Systems A. Approaches to Compensation B. Cascade Compensation Networks C. Proportional-Integral-Derivative Compensation D. Phase-Lead Compensation Design Using the Bode Diagram E. Phase-Lead Compensation Design Using the Root Locus F. Phase-Lag Compensation Design Using the Bode Diagram G. Phase-Lage Compensation Design Using the Root Locus H. Systems with a Pre-filterII. Analysis and Design of Control Systems using State Space Representations A. The State Variables of a Dynamic System B. The State Vector Differential Equation C. The Time Response and the Transition Matrix D. Solving the Linear, Time-Invariant State Equation E. State-spoace Representations of Transfer-Functions F. Signal Flow Graph State Models G. The Stability of Systems in the Time Domain H. Controllability and Observability I. Pole PlacementIII. Discrete-Time Control Systems A. Definition and Properties of the Z-Transform B. Transfer-Functions of Discrete-Data Systems C. Stability of Discrete-Data Systems and the Jury Criterion D. Steady-State Error ANalysis of Discrete-Data Control Systems E. Root-Loci of Discrete-Data Control Systems F. Digital Implementation of Analog Controllers G. Frequency Domain Design of Discrete-Data

Units: 4 (3 Lecture; 1 Discussion) Prerequisites: ENG 6 or MAT 22ALCatalog Description: Probabilistic and statistical analysis of electrical and computer systems. Discrete and continuous random variables, expectation and moments. Transformation of random variables. Joint and conditional densities. Limit theorems and statistics. Noise models, system reliability and testing. GE Credit: SEExpanded Course Description:I. Sample space and probability A. Events, axioms of probability B. Conditional probability, Bayes law C. IndependenceII. Discrete random variables A. Probability mass function B. Expectation, mean, variance C. Generating function D. Joint probability mass function of multiple discrete random variables E. Conditioning, independenceIII. Continuous random variables A. Cumulative probability distribution function and probability density B. Expectation, mean, characteristic function C. Transformation of a random variableIV. Joint random variables A. Joint probability distribution and densities B. Joint moments C. Transformation of multiple random variables D. Conditional densities, conditional expectation, repeated expectationsV. Sums of random variables A. Convergence of sequences of random variables B. Law of large numbers C. Central limit theorem D. Sampling statistics: sample mean, sample variance, confidence intervalsVI. Random processes A. Sample paths B. Mean, autocorrelation, autocovariance C. Random processes through linear filters D. Autocorrelation of modulated signals (optional) E. Thermal noise in electrical circuits (optional) F. Power spectral densityVII. Discrete-time Markov chains A. State transition diagram, one step transition matrix of a finite state homogenous Markov chain B. Computation of probability distribution, k step transition probability matrix C. State classification D. Steady-state behavior E. Application of Markov chain models to computer systems performance analysisVIII. Queueing Systems A. Poisson process B. Basic queueing theory:single server system C. Statistical analysis of queueing

Units: 4 (3 Lecture; 3 Laboratory [Completion of Three Lab-Oriented Projects])Prerequisites: EEC 151Course Description: Two-dimensional systems theory, image perception, sampling and quantization, transform theory and applications, enhancement, filtering and restoration, image analysis, and image processing systems.Expanded Course Description:I. Two-Dimensional Systems A. Linear systems and shift invariance B. Convolution summation C. Fourier transformsII. Image Perception A. Perception of brightness B. Perception of spatial information C. Color perception D. Temporal properties of visionIII. Image Sampling and Quantization A. Image scanning and television B. Two-dimensional sampling theory C. Practical limitations in sampling and reconstruction D. Image quantization E. Visual quantizationIV. Image Transforms A. Two-dimensional orthogonal and unitary transforms B. Discrete Fourier transform (DFT) C. Discrete cosine transform (DFT) D. Other transformsV. Image Enhancement A. Point operations B. Histogram modeling C. Spatial operations D. Transform operations E. Color image enhancementVI. Image Filtering and Restoration A. Image observation models B. Inverse and Wiener filtering C. Generalized inverse methods D. Coordinate transformation and geometric correctionVII. Image Analysis A. Spatial feature extraction B. Edge detection, boundary extraction and representation C. Structure D. Texture E. Scene matching and detection F. SegmentationVIII. Image Processing Systems A. Image processing hardware B. Image processing softwareIX. Laboratory Experiments: 1. In the laboratory, students will learn to use an image processing hardware and software system to perform a set of experiments, chosen from: 1. Image sampling and quantization 2. Fast Fourier transform 3. Nonlinear point operations 4. Histogram equalization 5. Spatial filtering 6. Edge detection 7. Shape analysis 8. Texture analysis